Surface Recombination Velocity Measurements of Metallized Surfaces by Photoluminescence Imaging
نویسندگان
چکیده
منابع مشابه
Quantitative surface recombination imaging of single side processed silicon wafers obtained by photoluminescence modeling
Characterizing the surface recombination of a silicon wafer is commonly performed by measuring the effective lifetime of a symmetrically processed sample and using simplified analytical models to derive a characteristic property of the recombination, such as the surface recombination factor J0s. The most widely used method is based on QSSPC measurements which require large, homogeneously proces...
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............................................................................................................................. iii Acknowledgements ............................................................................................................ vi Table of
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ژورنال
عنوان ژورنال: Energy Procedia
سال: 2013
ISSN: 1876-6102
DOI: 10.1016/j.egypro.2013.11.084